Characterizing ultralow emittance electron beams using structured light fields

نویسندگان

چکیده

Novel schemes for generating ultra-low emittance electron beams have been developed in the last years and promise compact particle sources with excellent beam quality suitable future high-energy physics experiments free-electron lasers. Current methods characterization of low such as pepperpot measurements or focus scanning are limited their capability to resolve emittances sub $0.1$ mm mrad regime. Here we propose a novel, highly sensitive method single shot waist using interfering laser beams. In this scheme, two pulses focused under an angle creating grating-like interference pattern. When interacts structured field, phase space becomes modulated by ponderomotive force results profile after further advance, which allows 2D PIC simulations show effectiveness technique normalized range $\epsilon_n=[0.01,1]$ mrad.

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ژورنال

عنوان ژورنال: Physical review accelerators and beams

سال: 2021

ISSN: ['2469-9888']

DOI: https://doi.org/10.1103/physrevaccelbeams.24.012803